The surface laboratory is furnished with an X-ray Photoelectron Spectrophotometer (Thermo Scientific, K-Alpha) with an aluminum X-ray source and argon ion gun. The instrument can provide elemental information about vacuum compatible samples. Samples tested include powders, fibers, films, bars, and paper. The presence of all elements except hydrogen and helium can be detected with a sensitivity of about 0.1 atomic % (1000 ppm). Chemical – chemical environment and oxidation states information can also be obtained. Source spot size ranges from 50 – 400 µm.

Physical Electronics PHI610 Scanning Auger Microprobe. This instrument allows us to analyze the top 3-10 nm of solids, films, coatings, and ceramics and can actively depth profile material using an argon ion gun to see changes in films from surface to sub-surface. The argon ion gun is also useful for analyzing un-oxidized surfaces of solid samples.

Our Hiden Analytical compact Secondary Ion Mass Spectrometer (SIMS). Another useful surface analysis technique that can obtain ppb range elemental analysis of the top few hundred nm of solid materials such as ceramics, metals, polymers, semiconductors, and others.